Effect of annealing on the electrophysical properties of CdTe/HgCdTe passivation interface by the capacitance-voltage characteristics of the metal-insulator-semiconductor structures
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作者: |
Wang, Xi; He, Kai; Chen, Xing; Li, Yang; Lin, Chun; Zhang, Qinyao; Ye, Zhenhua; Xin, Liwei; Gao, Guilong; Yan, Xin; Wang, Gang; Liu, Yiheng; Wang, Tao; Tian, Jinshou |
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AIP ADVANCES |
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论文题目: |
Effect of annealing on the electrophysical properties of CdTe/HgCdTe passivation interface by the capacitance-voltage characteristics of the metal-insulator-semiconductor structures |
发表年度: |
2020 |
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10 |
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10 |
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